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authorDonald Kjer <don.kjer@gmail.com>2021-08-23 15:15:34 -0700
committerGitHub <noreply@github.com>2021-08-23 23:15:34 +0100
commite756a21636149ad47c19c659d04be93cf3071dab (patch)
treeaa350c7209c5375f8a3c400353969d2ce0ed3748 /tmk_core/common/test/rules.mk
parent2481e109a0f79b4cdcecab4a6bf6755fb5eda3fc (diff)
eeprom_stm32: implement high density wear leveling (#12567)
* eeprom_stm32: implement wear leveling Update EECONFIG_MAGIC_NUMBER eeprom_stm32: check emulated eeprom size is large enough * eeprom_stm32: Increasing simulated EEPROM density on stm32 * Adding utility script to decode emulated eeprom * Adding unit tests * Applying qmk cformat changes * cleaned up flash mocking * Fix for stm32eeprom_parser.py checking via signature with wrong base * Fix for nk65 keyboard Co-authored-by: Ilya Zhuravlev <whatever@xyz.is> Co-authored-by: zvecr <git@zvecr.com>
Diffstat (limited to 'tmk_core/common/test/rules.mk')
-rw-r--r--tmk_core/common/test/rules.mk23
1 files changed, 23 insertions, 0 deletions
diff --git a/tmk_core/common/test/rules.mk b/tmk_core/common/test/rules.mk
new file mode 100644
index 0000000000..e47e5880c5
--- /dev/null
+++ b/tmk_core/common/test/rules.mk
@@ -0,0 +1,23 @@
+eeprom_stm32_DEFS := -DFLASH_STM32_MOCKED -DNO_PRINT -DFEE_FLASH_BASE=FlashBuf
+eeprom_stm32_tiny_DEFS := $(eeprom_stm32_DEFS) \
+ -DFEE_MCU_FLASH_SIZE=1 \
+ -DMOCK_FLASH_SIZE=1024 \
+ -DFEE_PAGE_SIZE=512 \
+ -DFEE_DENSITY_PAGES=1
+eeprom_stm32_large_DEFS := $(eeprom_stm32_DEFS) \
+ -DFEE_MCU_FLASH_SIZE=64 \
+ -DMOCK_FLASH_SIZE=65536 \
+ -DFEE_PAGE_SIZE=2048 \
+ -DFEE_DENSITY_PAGES=16
+
+eeprom_stm32_INC := \
+ $(TMK_PATH)/common/chibios/
+eeprom_stm32_tiny_INC := $(eeprom_stm32_INC)
+eeprom_stm32_large_INC := $(eeprom_stm32_INC)
+
+eeprom_stm32_SRC := \
+ $(TMK_PATH)/common/test/eeprom_stm32_tests.cpp \
+ $(TMK_PATH)/common/test/flash_stm32_mock.c \
+ $(TMK_PATH)/common/chibios/eeprom_stm32.c
+eeprom_stm32_tiny_SRC := $(eeprom_stm32_SRC)
+eeprom_stm32_large_SRC := $(eeprom_stm32_SRC)